Fully-parallel pattern-matching engine with dynamic adaptability to Hamming or Manhattan distance

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue CIRCUITS SYMP., 2002, Pages 252-255

  Mattausch, Hans Jürgen ^a   Omori, Nobuhiko ^a   Fukae, Seiji ^a   Koide, Tetsushi ^a   Gyoten, Takayuki ^b  

^a HIROSHIMA UNIVERSITY   (Japan)

^b MITSUBISHI ELECTRIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; DATA COMPRESSION; DATA STORAGE EQUIPMENT; PATTERN MATCHING; REAL TIME SYSTEMS;

PATTERN ENCODING; PATTERN MATCHING ENGINE;

INTEGRATED CIRCUIT TESTING;

EID: 0242443354     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

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