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Volumn 68, Issue 12, 2003, Pages

Nanoindentation: Depth dependence of silicon hardness studied within contact theory

Author keywords

[No Author keywords available]

Indexed keywords

DIAMOND; SILICON;

EID: 0242440175     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.68.125310     Document Type: Article
Times cited : (6)

References (49)
  • 21
    • 85012587852 scopus 로고
    • Academic Press, New York
    • G.W. Farnell, in Physical Acoustics (Academic Press, New York, 1970), Vol. 6, p. 109.
    • (1970) Physical Acoustics , vol.6
    • Farnell, G.W.1
  • 30
    • 77956922109 scopus 로고
    • edited by F. Seitz and D. Turnbull (Academic, New York
    • D.C. Wallace, in Solid State Physics, edited by F. Seitz and D. Turnbull (Academic, New York, 1970), Vol. 25, p. 301.
    • (1970) Solid State Physics , vol.25
    • Wallace, D.C.1
  • 40
    • 0041757439 scopus 로고
    • edited by F.R.N. Nabarro (Elsevier, New York, Chap
    • H. Alexander, in Dislocations in Solids, edited by F.R.N. Nabarro (Elsevier, New York, 1986), Chap. 35, p. 115.
    • (1986) Dislocations in Solids , vol.35
    • Alexander, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.