Optical properties of Er : YAG and Er : YAP materials and layers grown by laser

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5036, Issue , 2002, Pages 268-274

  Jelínek, Miroslav ^a   Oswald, Jiříf ^a   Studnička, Václav ^a   Lančok, Ján ^a   Pavelka, Martin ^a   Chvostovś, Dagmar ^a   Šlechtová, Věnceslava ^a   Nejezchleb, Karel ^b   Macková, Anna ^c   Grivas, Christos ^d  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b Crytur Ltd   (Czech Republic)

^c NUCLEAR PHYSICS INSTITUTE   (Czech Republic)

^d Inst of Electron Struct and Laser   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; ELLIPSOMETRY; IONS; LIGHT REFRACTION; LUMINESCENCE; WAVEGUIDES;

SPECTROSCOPIC ELLIPSOMETRY;

SEMICONDUCTOR LASERS;

EID: 0242407778     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.498510     Document Type: Conference Paper

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