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Volumn 190, Issue 5-8, 2003, Pages 911-924

Formation of Al-Si intermetallic phases

Author keywords

Interfaces; Intermetallics; Thin films

Indexed keywords

ALUMINUM; ANNEALING; ENERGY DISPERSIVE SPECTROSCOPY; INTERFACES (MATERIALS); METALLIC FILMS; METALLOGRAPHIC PHASES; SCANNING ELECTRON MICROSCOPY; SILICON; X RAY DIFFRACTION ANALYSIS;

EID: 0242380871     PISSN: 00986445     EISSN: None     Source Type: Journal    
DOI: 10.1080/00986440302126     Document Type: Article
Times cited : (5)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.