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Volumn 190, Issue 5-8, 2003, Pages 911-924
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Formation of Al-Si intermetallic phases
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Author keywords
Interfaces; Intermetallics; Thin films
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Indexed keywords
ALUMINUM;
ANNEALING;
ENERGY DISPERSIVE SPECTROSCOPY;
INTERFACES (MATERIALS);
METALLIC FILMS;
METALLOGRAPHIC PHASES;
SCANNING ELECTRON MICROSCOPY;
SILICON;
X RAY DIFFRACTION ANALYSIS;
INTERMETALLIC PHASES;
INTERMETALLICS;
INTERMETALLIC ALLOY;
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EID: 0242380871
PISSN: 00986445
EISSN: None
Source Type: Journal
DOI: 10.1080/00986440302126 Document Type: Article |
Times cited : (5)
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References (19)
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