Effect of microcracking on electric-field-induced stress intensity factors in dielectric ceramics

Philosophical Magazine

Volumn 83, Issue 2, 2003, Pages 277-294

  Ru, C Q ^a   Mao, Scott X ^b  

^a UNIVERSITY OF ALBERTA   (Canada)

^b University of Pittsburgh   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROCRACKING; PIEZOELECTRIC MATERIALS; STRESS INTENSITY FACTORS;

DIELECTRIC CERAMICS;

CERAMIC MATERIALS;

EID: 0242366156     PISSN: 14786435     EISSN: None     Source Type: Journal    
DOI: 10.1080/0141861021000024848     Document Type: Article

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