Electric-field induced interfacial cracking in multilayer electrostrictive actuators

Journal of the Mechanics and Physics of Solids

Volumn 46, Issue 8, 1998, Pages 1301-1318

  Ru, C Q ^a   Mao, X ^b   Epstein, M ^b  

^a UNIVERSITY OF ALBERTA   (Canada)

^b UNIVERSITY OF CALGARY   (Canada)

Author keywords

A. delamination; A. electromechanical processes; B. ceramic material

Indexed keywords

ACTUATORS; CALCULATIONS; CERAMIC MATRIX COMPOSITES; DELAMINATION; ELECTRIC FIELD EFFECTS; ELECTRODES; INTERFACES (MATERIALS); STRESS INTENSITY FACTORS;

ELECTRODE LAYER; ELECTROMECHANICAL PROCESS; ELECTROSTRICTIVE ACTUATOR; INTERFACIAL CRACKING;

CRACK PROPAGATION;

EID: 0032138360     PISSN: 00225096     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-5096(98)00038-6     Document Type: Article

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