Polarization characterization in surface second harmonic generation by nonlinear optical null ellipsometry

Analytica Chimica Acta

Volumn 496, Issue 1-2, 2003, Pages 133-142

  Plocinik, Ryan M ^a   Simpson, Garth J ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

Ellipsometry; Hyperpolarizability; Nonlinear optics; Second harmonic generation; Sum frequency generation

Indexed keywords

ELLIPSOMETRY; POLARIZATION; SPECTROSCOPIC ANALYSIS; THIN FILMS;

NONLINEAR OPTICAL NULL ELLIPSOMETRY (NONE);

SECOND HARMONIC GENERATION;

2 PROPANOL; DYE; ELEMENT; SILICON DIOXIDE;

ARTICLE; CHEMICAL ANALYSIS; COMPUTER INTERFACE; FILM; LIGHT; MATHEMATICAL ANALYSIS; NONLINEAR OPTICAL NULL ELLIPSOMETRY; NONLINEAR SYSTEM; OPTICAL INSTRUMENTATION; POLARIZATION; PRIORITY JOURNAL; REFRACTION INDEX; SPECTROSCOPY; SURFACE PROPERTY;

EID: 0242361604     PISSN: 00032670     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0003-2670(03)00994-2     Document Type: Article

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