Defects in CeO2/SrTiO3 fabricated by automatic feeding epitaxy probed using positron annihilation

Journal of Applied Physics

Volumn 94, Issue 8, 2003, Pages 5193-5198

  Uedono, A ^a   Shimoyama, K ^a,b   Kiyohara, M ^a   Yamabe, K ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b FUJI ELECTRIC CO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CERIUM COMPOUNDS; FILM GROWTH; MOLECULAR BEAM EPITAXY; POSITRON ANNIHILATION SPECTROSCOPY; STRONTIUM COMPOUNDS;

TRAPPING DEFECTS;

THIN FILMS;

EID: 0242348669     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1606112     Document Type: Article

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