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Volumn 41, Issue 4, 2003, Pages 681-698

Investigation of flow mechanisms in semiconductor wafer fabrication

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; FEEDBACK CONTROL; REAL TIME SYSTEMS; SCHEDULING;

EID: 0242333121     PISSN: 00207543     EISSN: None     Source Type: Journal    
DOI: 10.1080/0020754031000065476     Document Type: Article
Times cited : (9)

References (32)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.