A new similarity measure based on intraclass statistics for biometric systems

ETRI Journal

Volumn 25, Issue 5, 2003, Pages 401-406

  Lee, Kwanyong ^a   Park, Hyeyoung ^b  

^a Korea Cyber University   (South Korea)

^b RIKEN BRAIN SCIENCE INSTITUTE   (Japan)

Author keywords

Biometrics; Chi square distribution; Similarity measure; Statistical test theory; Statistical verification

Indexed keywords

DATA PROCESSING; DATA STRUCTURES; PROBABILITY DENSITY FUNCTION; PROBABILITY DISTRIBUTIONS; RANDOM PROCESSES; SET THEORY; STATISTICAL TESTS;

BIOMETRICS; CHI-SQUARE DISTRIBUTION; INTRACLASS STATISTICS; SIMILARITY MEASURE; STATISTICAL VERIFICATION;

LEARNING SYSTEMS;

EID: 0242323507     PISSN: 12256463     EISSN: None     Source Type: Journal    
DOI: 10.4218/etrij.03.0102.0017     Document Type: Article

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