-
1
-
-
0027577979
-
-
T. Nitta, T. Ohmi, T. Hoshi, S. Sakai, K. Sakaibara, S. Imai, T. Shibata, J.Electrochem. Soc. 140, 1131 (1995).
-
(1995)
J. Electrochem. Soc.
, vol.140
, pp. 1131
-
-
Nitta, T.1
Ohmi, T.2
Hoshi, T.3
Sakai, S.4
Sakaibara, K.5
Imai, S.6
Shibata, T.7
-
2
-
-
0001519648
-
-
J.M. Steigerwald, S.P. Murarka, R.J. Gutmann, D.J. Duquette, Mater. Chem. Phys. 41, 217 (1995).
-
(1995)
Mater. Chem. Phys.
, vol.41
, pp. 217
-
-
Steigerwald, J.M.1
Murarka, S.P.2
Gutmann, R.J.3
Duquette, D.J.4
-
3
-
-
0029325535
-
-
C.K. Hu, B. Luther, F.B. Kaufman, J. Humnel, C. Uzoh, and D.J. Pearson, Thin Solid Films, 262, 84 (1994).
-
(1994)
Thin Solid Films
, vol.262
, pp. 84
-
-
Hu, C.K.1
Luther, B.2
Kaufman, F.B.3
Humnel, J.4
Uzoh, C.5
Pearson, D.J.6
-
4
-
-
0028486133
-
-
S. Lakshminarayanan, J.M. Steigerward, D.T. Price, M. Bourgeois, T.P. Chow, R.J. Gutmamn, and S.P. Murarka, IEEE Electron. Device Lett., 15, 307 (1994).
-
(1994)
IEEE Electron. Device Lett.
, vol.15
, pp. 307
-
-
Lakshminarayanan, S.1
Steigerward, J.M.2
Price, D.T.3
Bourgeois, M.4
Chow, T.P.5
Gutmamn, R.J.6
Murarka, S.P.7
-
5
-
-
0036962125
-
-
S. Tamilmani, W. Huang, S. Raghavan, and R. Small, J. Electrochem. Soc. 149, G638 (2002).
-
(2002)
J. Electrochem. Soc.
, vol.149
-
-
Tamilmani, S.1
Huang, W.2
Raghavan, S.3
Small, R.4
-
6
-
-
0030197845
-
-
Q. Luo, D.R. Campbell, and S.V. Babu, Langmuir, 12, 3563 (1996).
-
(1996)
Langmuir
, vol.12
, pp. 3563
-
-
Luo, Q.1
Campbell, D.R.2
Babu, S.V.3
-
7
-
-
0031367264
-
-
Q. Luo, D.R. Campbell, and S.V. Babu, Thin Solid Films, 311, 177 (1997).
-
(1997)
Thin Solid Films
, vol.311
, pp. 177
-
-
Luo, Q.1
Campbell, D.R.2
Babu, S.V.3
-
8
-
-
0029389318
-
-
R. Carpio, J. Farkas, and R. Jairath, Thin Solid Films, 266, 238 (1995).
-
(1995)
Thin Solid Films
, vol.266
, pp. 238
-
-
Carpio, R.1
Farkas, J.2
Jairath, R.3
-
10
-
-
0242336186
-
-
U.S. Pat. 5,575,885 (1996)
-
H. Hirabayashi, M. Huguchi, M. Kinoshita, H. Kaneko, N. Hayasaska, K. Mase, and J. Oshima, U.S. Pat. 5,575,885 (1996).
-
-
-
Hirabayashi, H.1
Huguchi, M.2
Kinoshita, M.3
Kaneko, H.4
Hayasaska, N.5
Mase, K.6
Oshima, J.7
-
11
-
-
0009546965
-
-
Institute for Microelectronics Interconnection
-
st International Chemical-Mechanical Planarization for VLSI/ULSI Multilevel Interconnection Conference CMP-MIC, Institute for Microelectronics Interconnection, 1996, p. 119.
-
(1996)
st International Chemical-mechanical Planarization for VLSI/ULSI Multilevel Interconnection Conference CMP-MIC
, pp. 119
-
-
Hirabayashi, H.1
Huguchi, M.2
Kinoshita, M.3
Kaneko, H.4
Hayasaska, N.5
Mase, K.6
Oshima, J.7
-
13
-
-
0034292727
-
-
M. Hariharaputhiran, J. Zhang, S. Ramarajan, J. J. Keleher, Y. Li, S. V. Babu, J. Electrochem. Soc., 147, 3820 (2000).
-
(2000)
J. Electrochem. Soc.
, vol.147
, pp. 3820
-
-
Hariharaputhiran, M.1
Zhang, J.2
Ramarajan, S.3
Keleher, J.J.4
Li, Y.5
Babu, S.V.6
-
15
-
-
0242367668
-
-
A. A. El-Shafei, M. N. H. Moussa, A. A. El-Far, J. Appl. Electrochemistry, 27, 1339 (1997).
-
(1997)
J. Appl. Electrochemistry
, vol.27
, pp. 1339
-
-
El-Shafei, A.A.1
Moussa, M.N.H.2
El-Far, A.A.3
|