Features of charge carrier transport determined from carrier extraction current in μc-Si:H

Journal of Non-Crystalline Solids

Volumn 299-302, Issue , 2002, Pages 375-379

  Juka G ^a   Arlauskas, K ^a   Nekraas N ^a   Stuchlik, J ^b   Niquille, X ^c   Wyrsch, N ^c  

^a VILNIUS UNIVERSITY   (Lithuania)

^b INSTITUTE OF PHYSICS   (Czech Republic)

^c UNIVERSITY OF NEUCHÂTEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTRIC FIELD EFFECTS; ELECTRON MOBILITY; HOLE MOBILITY; PHOTOCONDUCTIVITY; SEMICONDUCTOR DOPING; THERMAL EFFECTS;

CHARGE CARRIER TRANSPORT;

SEMICONDUCTING SILICON;

EID: 17644439807     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(01)01183-8     Document Type: Article

References (7)