Trap-assisted tunneling in p-Si/SiO2 structures

Journal of Materials Science: Materials in Electronics

Volumn 14, Issue 10-12, 2003, Pages 801-802

  Simeonov, S ^a   Gushterov, A ^a   Kafedjiiska, E ^a   Szekeres, A ^a  

^a INSTITUTE OF SOLID STATE PHYSICS   (Bulgaria)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; LEAKAGE CURRENTS; PLASMAS; SEMICONDUCTING SILICON;

TRAP-ASSISTED TUNNELING;

SILICA;

EID: 0242304421     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1026165523419     Document Type: Conference Paper

References (7)

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