Measurement of gain spectrum for semiconductor lasers utilizing integrations of product of emission spectrum and a phase function over one mode interval

IEEE Photonics Technology Letters

Volumn 15, Issue 11, 2003, Pages 1510-1512

  Guo, Wei Hua ^a   Lu, Qiao Yin ^a   Huang, Yong Zhen ^a   Yu, Li Juan ^a  

^a INSTITUTE OF SEMICONDUCTORS   (China)

Author keywords

Gain measurement; Optical spectrum analyzer (OSA); Semiconductor lasers

Indexed keywords

INTEGRATION; LIGHT REFLECTION; OPTICAL DEVICES; OPTICAL RESOLVING POWER; REFRACTIVE INDEX; SPECTRUM ANALYZERS; SPONTANEOUS EMISSION;

AMPLIFIED SPONTANEOUS EMISSION SPECTRUM; FABRY-PEROT SEMICONDUCTOR LASERS; OPTICAL SPECTRUM ANALYZER;

SEMICONDUCTOR LASERS;

EID: 0242302553     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2003.818642     Document Type: Article

References (8)

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