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Volumn , Issue , 2003, Pages 377-382

Influences of Pulse Parameters on Properties of Optical Coatings Deposited by Reactive Pulsed Magnetron Sputtering

Author keywords

Multilayer stacks; Optical coatings; Pulsed sputtering; Reactive sputtering

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELLIPSOMETRY; MAGNETRON SPUTTERING; OPTICAL MULTILAYERS; SILICON WAFERS; X RAY DIFFRACTION;

EID: 0242290405     PISSN: 07375921     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (10)
  • 10
    • 0032000203 scopus 로고    scopus 로고
    • Spectroscopic ellipsometry characterization of thin-film silicon nitride
    • G.E. Jellison Jr., F.A. Modine, P. Doshi, A. Rohatgi "Spectroscopic ellipsometry characterization of thin-film silicon nitride", Thin Solid Films 313-314, p. 193-197, 1998.
    • (1998) Thin Solid Films , vol.313-314 , pp. 193-197
    • Jellison G.E., Jr.1    Modine, F.A.2    Doshi, P.3    Rohatgi, A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.