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Volumn 14, Issue 10-12, 2003, Pages 747-748
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Polycrystalline silicon thin films obtained by metal-induced crystallization
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CRYSTALLIZATION;
POLYCRYSTALLINE MATERIALS;
RAMAN SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
X RAY PHOTOELECTRON SPECTROSCOPY;
THERMAL EVAPORATION;
THIN FILMS;
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EID: 0242285606
PISSN: 09574522
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1026164028445 Document Type: Conference Paper |
Times cited : (6)
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References (5)
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