Inductance deep-level transient spectroscopy for determining temperature-dependent resistance and capacitance of Schottky diodes

Review of Scientific Instruments

Volumn 74, Issue 10, 2003, Pages 4561-4563

  Rangel Kuoppa, V T ^a   Pessa, M ^a  

^a TAMPERE UNIVERSITY OF TECHNOLOGY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRIC RESISTANCE; INDUCTANCE;

ELECTRICAL DEFECTS;

SCHOTTKY BARRIER DIODES;

EID: 0142229396     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1610786     Document Type: Article

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