Accumulation-Mode Pi-gate MOSFET

IEEE International SOI Conference

Volumn , Issue , 2003, Pages 65-67

  Park, J W ^a   Xiong, W ^b   Colinge, J P ^c  

^a Kumoh National Institute of Technology   (South Korea)

^b SEMATECH   (United States)

^c University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GATES (TRANSISTOR); LEAKAGE CURRENTS; SEMICONDUCTOR DOPING; SILICON ON INSULATOR TECHNOLOGY;

GATE LENGTH;

MOSFET DEVICES;

EID: 0142217049     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/soi.2003.1242900     Document Type: Conference Paper

References (9)

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