메뉴 건너뛰기




Volumn 90, Issue 2, 2003, Pages 99-108

Design of a CMOS opamp input stage immune to EMI

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTROMAGNETIC WAVE INTERFERENCE; MOS DEVICES;

EID: 0142197749     PISSN: 00207217     EISSN: None     Source Type: Journal    
DOI: 10.1080/00207210310001595356     Document Type: Article
Times cited : (2)

References (9)
  • 1
    • 0026106047 scopus 로고
    • Prediction of RFI demodulation in BiFET, BiMOS and CMOS operational amplifiers
    • ABUELMA'ATTI, M. T., 1991, Prediction of RFI demodulation in BiFET, BiMOS and CMOS operational amplifiers. IEE Proceedings G on Circuits, Devices and Systems, 138,56-60.
    • (1991) IEE Proceedings G on Circuits, Devices and Systems , vol.138 , pp. 56-60
    • Abuelma'Atti, M.T.1
  • 2
    • 0142160837 scopus 로고    scopus 로고
    • Large-signal analysis of CMOS analogue functional elements using Fourier-series approximations
    • ABUELMA'ATTI, M. T., 2001, Large-signal analysis of CMOS analogue functional elements using Fourier-series approximations. International Journal of Electronics, 88, 665-675.
    • (2001) International Journal of Electronics , vol.88 , pp. 665-675
    • Abuelma'atti, M.T.1
  • 3
    • 0004146230 scopus 로고    scopus 로고
    • August
    • STMICROELECTRONICS, 1997. BCD3s layout manual. August.
    • (1997) BCD3s Layout Manual
  • 5
    • 0036505229 scopus 로고    scopus 로고
    • Nonlinear effects of radio-frequency interference in MOS operational amplifiers
    • FIORI, F., and CROVETTI, P.S., 2002, Nonlinear effects of radio-frequency interference in MOS operational amplifiers. IEEE Transactions on Circuits and Systems - I, 49, 367-372.
    • (2002) IEEE Transactions on Circuits and Systems - I , vol.49 , pp. 367-372
    • Fiori, F.1    Crovetti, P.S.2
  • 6
    • 0026953386 scopus 로고
    • EMI-induced failures in integrated circuit operational amplifiers
    • GRAFFI, S., MASETTI, G., and GOLZIO, D., 1992, EMI-induced failures in integrated circuit operational amplifiers. Microelectronics Reliability, 32, 1551-1557.
    • (1992) Microelectronics Reliability , vol.32 , pp. 1551-1557
    • Graffi, S.1    Masetti, G.2    Golzio, D.3
  • 7
    • 0030833533 scopus 로고    scopus 로고
    • Criteria to reduce failures from conveyed electromagnetic interference in CMOS operational amplifiers
    • GRAFFI, S., MASETTI, G., and PIOVACCARI, A., 1997, Criteria to reduce failures from conveyed electromagnetic interference in CMOS operational amplifiers, Microelectronics Reliability, 37, 95-113.
    • (1997) Microelectronics Reliability , vol.37 , pp. 95-113
    • Graffi, S.1    Masetti, G.2    Piovaccari, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.