Recombination echoes in disordered silicon

Journal of Materials Science: Materials in Electronics

Volumn 14, Issue 10-12, 2003, Pages 635-639

  Lips, K ^a   Boehme, C ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; HYDROGENATION; PHOTOCURRENTS; SPECTROSCOPIC ANALYSIS;

ECHOES;

SILICON;

EID: 0142196479     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1026142028928     Document Type: Conference Paper

References (9)

1. K. LIPS, C. LERNER and W. FUHS, in "Thin Film Material and Devices-Developments in Science and Technology", edited by J. M. Marshall, N. Kirov, A. Vavrek, A. and J. M. Maud (World Scientific, Singapore, 1999) p. 141.
2. M. STUTZMANN, M. S. BRANDT and M. W. BAYERL, J. Non-Cryst. Solids 266-269 (2000) 1.
3. P. KANSCHAT, K. LIPS and W. FUHS, ibid. 266-269 (2000) 524.
4. C. BOEHME and K. LIPS, Appl. Phys. Lett. 79 (2001) 4363.
5. C. BOEHME, P. KANSCHAT and K. LIPS, Nucl. Instrum. Methods B 186 (2001) 30.
6. C. BOEHME, PhD thesis, Fachbereich Physik, Philipps-Universität Marburg (2003).
7. C. BOEHME and K. LIPS, Mater. Res. Soc. Symp. Proc. 715 (2002) A16.2.
8. C. BOEHME and K. LIPS, Phys. Status Solidi B 233 (2002) 427.
9. C. BOEHME, P. KANSCHAT and K. LIPS, Europhys. Lett. 56 (2001) 716.