Time domain measurement of spin-dependent recombination - A novel defect spectroscopy method

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 186, Issue 1-4, 2002, Pages 30-35

  Boehme, Christoph ^a   Kanschat, Peter ^a   Lips, Klaus ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

EDMR; ESR; Microcrystalline silicon; Pulsed magnetic resonance; Spin dependent recombination

Indexed keywords

CHARGE CARRIERS; DISSOCIATION; MAGNETIC FIELD EFFECTS; MATHEMATICAL MODELS; MICROWAVES; PARAMAGNETIC RESONANCE; POLYSILICON; TIME DOMAIN ANALYSIS;

SPIN DEPENDENT RECOMBINATION;

CRYSTAL DEFECTS;

EID: 0036136632     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)00869-2     Document Type: Article

References (8)