Electron-momentum spectroscopy of crystal silicon

Physical Review B - Condensed Matter and Materials Physics

Volumn 57, Issue 20, 1998, Pages 12882-12889

  Fang, Z ^a   Matthews, R ^a   Utteridge, S ^a   Vos, M ^b  

^a FLINDERS UNIVERSITY   (Australia)

^b AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012906103     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.57.12882     Document Type: Article

References (15)

1. I. E. McCarthy and E. Weigold, Rep. Prog. Phys. 54, 789 (1991).
2. M. Vos and I. E. McCarthy, Rev. Mod. Phys. 67, 713 (1995).
3. M. Vos and M. Bottema, Phys. Rev. B 54, 5946 (1996).
4. S. A. Canney, M. Vos, A. S. Kheifets, N. Clisby, I. E. McCarthy, and E. Weigold, J. Phys.: Condens. Matter 9, 1931 (1997).
5. C. J. Humphreys, Rep. Prog. Phys. 42, 1825 (1979).
6. L. J. Allen, I. E. McCarthy, V. W. Maslen, and C. J. Rossouw, Aust. J. Phys. 43, 453 (1990).
7. M. Vos, Z. Fang, S. A. Canney, A. S. Kheifets, I. E. McCarthy, and E. Weigold, Phys. Rev. B 56, 963 (1997).
8. J. C. Slater and G. F. Koster, Phys. Rev. 94, 1498 (1954).
9. P. Löwdin, J. Chem. Phys. 18, 365 (1950); in Advances in Quantum Chemistry, edited by P. Lowdin (Academic, New York, 1970), p. 185.
10. P. Storer, R. S. Caprari, S. A. C. Clark, M. Vos, and E. Weigold, Rev. Sci. Instrum. 65, 2214 (1994).
11. Z. Fang, X. Guo, S. Utteridge, S. Canney, I. McCarthy, M. Vos, and E. Weigold, Rev. Sci. Instrum. 68, 4396 (1997).
12. P. B. Hirsch, A. Howie, R. B. Nigholson, D. W. Pashley, and M. J. Whelan, Electron Microscopy of Thin Crystals (Krieger, New York, 1977).
13. K. W. Andrews, D. J. Dyson, and S. R. Keown, Interpretation of Electron Diffraction Patterns (Plenum, New York, 1971).
14. M. Vos, R. S. Caprari, P. Storer, I. E. McCarthy, and E. Weigold, Can. J. Phys. 74, 829 (1996).
15. G. A. Baker, I. E. McCarthy, and C. E. Porter, Phys. Rev. 120, 254 (1960).