Piezoscopic deep-level transient spectroscopy studies of the silicon divacancy

Physical Review B - Condensed Matter and Materials Physics

Volumn 65, Issue 11, 2002, Pages 1132031-1132034

  Dobaczewski, L ^a,b   Goscinski K ^a   Zytkiewicz Z R ^a   Nielsen, K Bonde ^c   Rubaldo, L ^b,d   Andersen, O ^b   Peaker, A R ^b  

^a INSTITUTE OF PHYSICS   (Poland)

^b UNIVERSITY OF MANCHESTER   (United Kingdom)

^c AARHUS UNIVERSITY   (Denmark)

^d CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ARTICLE; CALCULATION; COMPLEX FORMATION; MATHEMATICAL ANALYSIS; MEASUREMENT; QUANTUM THEORY; SPECTROSCOPY;

EID: 0142137402     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (19)