Revision of TV Thomson scattering data analysis and detection of profile structure

Review of Scientific Instruments

Volumn 74, Issue 9, 2003, Pages 3998-4011

  Van Milligen, B Ph ^a   Classen, I G J ^b   Barth, C J ^b  

^a LABORATORIO NACIONAL DE FUSIÓN   (Spain)

^b FOM INSTITUTE FOR PLASMA PHYSICS RIJNHUIZEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CHARGE COUPLED DEVICES; ELECTRONS; LIGHT SCATTERING; PLASMA DENSITY; STATISTICAL TESTS; TEMPERATURE MEASUREMENT; TOKAMAK DEVICES;

THOMSON SCATTERING;

PLASMA DIAGNOSTICS;

EID: 0142134385     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1597951     Document Type: Article

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