Detecting pattern-based outliers

Pattern Recognition Letters

Volumn 24, Issue 16, 2003, Pages 3059-3068

  Hu, Tianming ^a   Sung, Sam Y ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Clustering; Complete spatial randomness; Outlier detection; Regular spacing

Indexed keywords

DATA REDUCTION; PATTERN RECOGNITION SYSTEMS;

HIGH DENSITY CLUSTERING;

PATTERN RECOGNITION;

PATTERN RECOGNITION;

EID: 0142120485     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-8655(03)00165-X     Document Type: Article

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