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Volumn 10, Issue 6, 2002, Pages 403-405
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Effect of CVI Temperature on the Microstructure of Nextel 480/SiO 2
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Author keywords
[No Author keywords available]
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Indexed keywords
AGGREGATES;
DECOMPOSITION;
INFILTRATION;
MICROSTRUCTURE;
CHEMICAL VAPOR INFILTRATION (CVI);
SILICA;
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EID: 0142085899
PISSN: 0334181X
EISSN: None
Source Type: Journal
DOI: 10.1515/secm.2002.10.6.403 Document Type: Article |
Times cited : (8)
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References (5)
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