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Volumn 21, Issue 5, 2003, Pages

Transition from reciprocal-space to real-space surface science - Advent of the scanning tunneling microscope

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING SYSTEMS; LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE; DIFFRACTION; IMAGING TECHNIQUES; SURFACE TREATMENT;

EID: 0142058294     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1599861     Document Type: Conference Paper
Times cited : (3)

References (68)
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