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3
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36849139764
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Structure and Adsorption Characteristics of Clean Surfaces of Germanium and Silicon
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R. E. Schlier and H. E. Farnsworth, "Structure and Adsorption Characteristics of Clean Surfaces of Germanium and Silicon," J. Chem. Phys. 30, 917 (1959).
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Schlier, R.E.1
Farnsworth, H.E.2
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Structural Properties of Cleaved Silicon and Germanium Surfaces
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J. J. Lander, G. W. Gobeli, and J. Morrison, "Structural Properties of Cleaved Silicon and Germanium Surfaces," J. Appl. Phys. 34, 2298 (1963).
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J. Appl. Phys.
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Gobeli, G.W.2
Morrison, J.3
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Secondary Electron Emission of Vacuum-Cleaved Solids
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N. R. Whetten, "Secondary Electron Emission of Vacuum-Cleaved Solids," J. Vac. Sci. Technol. 2, 84 (1965).
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Whetten, N.R.1
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6
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-
84938021607
-
-
Report No. 67-C-087, General Electric R&D Center (March)
-
An interesting summary of surface cleaning techniques at the time is given by R. W. Roberts, "Clean Surfaces: Their Preparation and Characterization," Report No. 67-C-087, General Electric R&D Center (March 1967).
-
(1967)
Clean Surfaces: Their Preparation and Characterization
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Roberts, R.W.1
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7
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Das Feldionenmikroskop
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E. W. Mueller, "Das Feldionenmikroskop," Z. Phys. 131, 136 (1951).
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Z. Phys.
, vol.131
, pp. 136
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Mueller, E.W.1
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8
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Field Ion Microscopy
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E. W. Mueller, "Field Ion Microscopy," Science 149, 591 (1965).
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Science
, vol.149
, pp. 591
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Mueller, E.W.1
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9
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-
12444323916
-
-
note
-
I was privileged to work in the Mueller Lab at Penn State in the early 1960's (as a very young child) and personally observed Mueller at work.
-
-
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10
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0142087342
-
A New Method of Investigation the Diffraction of Slow Electrons
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W. Ehrenberg, "A New Method of Investigation the Diffraction of Slow Electrons," Philos. Mag. 18, 878 (1934).
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Philos. Mag.
, vol.18
, pp. 878
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Ehrenberg, W.1
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11
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Apparatus for Direct Observation of Low-Energy Electron Diffraction Patterns
-
E. J. Scheibner, L. H. Germer, and C. D. Hartman, "Apparatus for Direct Observation of Low-Energy Electron Diffraction Patterns," Rev. Sci. Instrum. 31, 112 (1960).
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Rev. Sci. Instrum.
, vol.31
, pp. 112
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Scheibner, E.J.1
Germer, L.H.2
Hartman, C.D.3
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12
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0142023602
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The Structure of Crystal Surfaces
-
L. H. Germer, "The Structure of Crystal Surfaces," Sci. Am. March, 32 (1965).
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(1965)
Sci. Am. March
, pp. 32
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Germer, L.H.1
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14
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0343204892
-
Scattering of Low-Energy Electrons from Surfaces
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M. B. Webb and M. G. Lagally, "Scattering of Low-Energy Electrons from Surfaces," Solid State Phys. 28, 301 (1973).
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(1973)
Solid State Phys.
, vol.28
, pp. 301
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Webb, M.B.1
Lagally, M.G.2
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15
-
-
0142055682
-
Kinematic Low-Energy Electron Diffraction Intensities from Averaged Data: A Method for Surface Crystallography
-
M. G. Lagally, T. C. Ngoc, and M. B. Webb, "Kinematic Low-Energy Electron Diffraction Intensities from Averaged Data: A Method for Surface Crystallography," Phys. Rev. Lett. 26, 1557 (1971); M. G. Lagally, T. C. Ngoc, and M. B. Webb, "Averaged Low-Energy Electron Diffraction Intensities from Ni(111)," J. Vac. Sci. Technol. 9, 645 (1972).
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Phys. Rev. Lett.
, vol.26
, pp. 1557
-
-
Lagally, M.G.1
Ngoc, T.C.2
Webb, M.B.3
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16
-
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0142055682
-
Averaged Low-Energy Electron Diffraction Intensities from Ni(111)
-
M. G. Lagally, T. C. Ngoc, and M. B. Webb, "Kinematic Low-Energy Electron Diffraction Intensities from Averaged Data: A Method for Surface Crystallography," Phys. Rev. Lett. 26, 1557 (1971); M. G. Lagally, T. C. Ngoc, and M. B. Webb, "Averaged Low-Energy Electron Diffraction Intensities from Ni(111)," J. Vac. Sci. Technol. 9, 645 (1972).
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(1972)
J. Vac. Sci. Technol.
, vol.9
, pp. 645
-
-
Lagally, M.G.1
Ngoc, T.C.2
Webb, M.B.3
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17
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Krieger, Huntington, NY
-
P. Hirsch, A. Howie, R. Nicholson, W. Pashley, and M. J. Whelan, Electron Microscopy of Thin Crystals (Krieger, Huntington, NY, 1977), p. 156; P. B. Hirsch, A. Howie, and M. J. Whelan, Philos. Trans. R. Soc. London, Ser. A 252, 499 (1960).
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(1977)
Electron Microscopy of Thin Crystals
, pp. 156
-
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Hirsch, P.1
Howie, A.2
Nicholson, R.3
Pashley, W.4
Whelan, M.J.5
-
18
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-
P. Hirsch, A. Howie, R. Nicholson, W. Pashley, and M. J. Whelan, Electron Microscopy of Thin Crystals (Krieger, Huntington, NY, 1977), p. 156; P. B. Hirsch, A. Howie, and M. J. Whelan, Philos. Trans. R. Soc. London, Ser. A 252, 499 (1960).
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Philos. Trans. R. Soc. London, Ser. A
, vol.252
, pp. 499
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Hirsch, P.B.1
Howie, A.2
Whelan, M.J.3
-
19
-
-
0001940245
-
Electron Diffraction and Surface Defect Sturcture
-
edited by H. Ibach (Springer, Berlin)
-
Martin Henzler pointed out its use explicitly in LEED: M. Henzler, "Electron Diffraction and Surface Defect Sturcture," in Electron Spectroscopy for Surface Analysis, edited by H. Ibach (Springer, Berlin, 1977).
-
(1977)
Electron Spectroscopy for Surface Analysis
-
-
Henzler, M.1
-
20
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0016890857
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Atomic Steps on Single Crystals: Experimental Methods and Properties
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M. Henzler, "Atomic Steps on Single Crystals: Experimental Methods and Properties," Appl. Phys. 9, 11 (1976).
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Appl. Phys.
, vol.9
, pp. 11
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21
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edited by R. L. Park and M. G. Lagally (Academic, New York)
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M. G. Lagally, "Diffraction Techniques," in Methods of Experimental Physics, edited by R. L. Park and M. G. Lagally (Academic, New York, 1985), Vol. 22.
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(1985)
Methods of Experimental Physics
, vol.22
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Lagally, M.G.1
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The Growth of Crystals and the Equilibrium Structure of Their Surfaces
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W. K. Burton, N. Cabrera, and F. C. Frank, "The Growth of Crystals and the Equilibrium Structure of Their Surfaces," Philos. Trans. R. Soc. London, Ser. A 243, 299 (1951).
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, vol.243
, pp. 299
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Burton, W.K.1
Cabrera, N.2
Frank, F.C.3
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24
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W. H. Freeman and Company, San Francisco, also Dover, Toronto
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A. Guinier, X-Ray Diffraction in Crystals, Imperfect Crystals, and Amorphous Bodies (W. H. Freeman and Company, San Francisco, 1963, also Dover, Toronto, 1994).
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(1963)
X-Ray Diffraction in Crystals, Imperfect Crystals, and Amorphous Bodies
-
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Guinier, A.1
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25
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36849110552
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Atomic View of Surface Self-Diffusion: Tungsten on Tungsten
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G. Ehrlich and F. G. Hudda, "Atomic View of Surface Self-Diffusion: Tungsten on Tungsten," J. Chem. Phys. 44, 1039 (1966).
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J. Chem. Phys.
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Ehrlich, G.1
Hudda, F.G.2
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Quantitative Examination of Individual Atomic Events on Solids
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G. Ehrlich, "Quantitative Examination of Individual Atomic Events on Solids," J. Vac. Sci. Technol. 17, 9 (1980).
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, vol.17
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84951240957
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Surface Microtopography
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R. D. Young, "Surface Microtopography," Phys. Today 24, 42 (1971). See also http://www.physics.nist.gov/GenInt/STM/topograf.html; and R. Young, J. Ward, and F. Scire, "Observation of Metal-Vacuum-Metal Tunneling, Field Emission, and the Transition Regime," Phys. Rev. Lett. 27, 922 (1971).
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(1971)
Phys. Today
, vol.24
, pp. 42
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Young, R.D.1
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29
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Observation of Metal-Vacuum-Metal Tunneling, Field Emission, and the Transition Regime
-
R. D. Young, "Surface Microtopography," Phys. Today 24, 42 (1971). See also http://www.physics.nist.gov/GenInt/STM/topograf.html; and R. Young, J. Ward, and F. Scire, "Observation of Metal-Vacuum-Metal Tunneling, Field Emission, and the Transition Regime," Phys. Rev. Lett. 27, 922 (1971).
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Phys. Rev. Lett.
, vol.27
, pp. 922
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Young, R.1
Ward, J.2
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30
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personal communication
-
C. J. Powell (personal communication).
-
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Powell, C.J.1
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31
-
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12444253269
-
-
note
-
In a recent conversation (MRS meeting, Dec. 2002), Christoph Gerber, who was very much present at the creation, told me it was he who discovered Russ Young's work shortly before the first STM images were obtained. He told me everyone was completely shocked that they had overlooked this work. He concluded only that we all stand on the shoulders of those who come before, even if we don't realize it.
-
-
-
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32
-
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0142023599
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The best reference source for the earliest STM work is IBM
-
The best reference source for the earliest STM work is IBM J. Res. Dev. 30, 353-572 (1986).
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J. Res. Dev.
, vol.30
, pp. 353-572
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33
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The personal account of Gerd Binnig and Heini Rohrer can be found at http://www.nobel.se/physics/laureates/1986/binnig-lecture.html; also Rev. Mod. Phys. 59, 615 (1987).
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(1987)
Rev. Mod. Phys.
, vol.59
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34
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Diffraction from Disordered Surfaces: An Overview
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edited by P. K. Larsen and P. J. Dobson (Plenum, New York)
-
M. G. Lagally, D. E. Savage, and M. C. Tringides, "Diffraction from Disordered Surfaces: An Overview," in Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces, edited by P. K. Larsen and P. J. Dobson (Plenum, New York, 1988).
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(1988)
Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces
-
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Lagally, M.G.1
Savage, D.E.2
Tringides, M.C.3
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35
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12444344004
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personal communication
-
Ruud Tromp (personal communication).
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Tromp, R.1
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36
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0000275372
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Tunneling Images of Germanium Surface Reconstructions and Phase Boundaries
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R. S. Becker, J. A. Golovchenko, and B. S. Swartzentruber, "Tunneling Images of Germanium Surface Reconstructions and Phase Boundaries," Phys. Rev. Lett. 54, 2678 (1985).
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, vol.54
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Becker, R.S.1
Golovchenko, J.A.2
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37
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12444258081
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personal communication
-
Brian Swartzentruber (personal communication).
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Swartzentruber, B.1
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38
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0042176172
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A Simplified Scanning Tunneling Microscope for Surface Science Studies
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J. E. Demuth, R. J. Hamers, R. M. Tromp, and M. E. Welland, "A Simplified Scanning Tunneling Microscope for Surface Science Studies," J. Vac. Sci. Technol. A 4, 1320 (1986).
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, vol.4
, pp. 1320
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Demuth, J.E.1
Hamers, R.J.2
Tromp, R.M.3
Welland, M.E.4
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39
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12444347799
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personal communication
-
Robert Hamers (personal communication).
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Hamers, R.1
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40
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19044362545
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7×7 Reconstruction on Si(111) Resolved in Real Space
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G. Binnig, H. Rohrer, C. Gerber, and E. Weibel, "7×7 Reconstruction on Si(111) Resolved in Real Space," Phys. Rev. Lett. 50, 120 (1983).
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Phys. Rev. Lett.
, vol.50
, pp. 120
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Binnig, G.1
Rohrer, H.2
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Weibel, E.4
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41
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84913417435
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Structure Analysis of Si(111)7×7 Reconstructed Surface by Transmission Electron Diffraction and Microscopy
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K. Takayanagi, Y. Tanishiro, S. Takahashi, and M. Takahashi, "Structure Analysis of Si(111)7×7 Reconstructed Surface by Transmission Electron Diffraction and Microscopy," J. Vac. Sci. Technol. A 3, 1502 (1985).
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(1985)
J. Vac. Sci. Technol. A
, vol.3
, pp. 1502
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Takayanagi, K.1
Tanishiro, Y.2
Takahashi, S.3
Takahashi, M.4
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42
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0000984052
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Tunneling Images of Atomic Steps on the Si(111)7×7 Surface
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R. S. Becker, J. A. Golovchenko, E. G. McRae, and B. S. Swartzentruber, "Tunneling Images of Atomic Steps on the Si(111)7×7 Surface," Phys. Rev. Lett. 55, 2028 (1985).
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(1985)
Phys. Rev. Lett.
, vol.55
, pp. 2028
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Becker, R.S.1
Golovchenko, J.A.2
McRae, E.G.3
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43
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0000067154
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Real-Space Observation of Surface States on Si(111)7×7 with the Tunneling Microscope
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R. S. Becker, J. A. Golovchenko, D. R. Hamann, and B. S. Swartzentruber, "Real-Space Observation of Surface States on Si(111)7×7 with the Tunneling Microscope," Phys. Rev. Lett. 55, 2032 (1985).
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(1985)
Phys. Rev. Lett.
, vol.55
, pp. 2032
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Becker, R.S.1
Golovchenko, J.A.2
Hamann, D.R.3
Swartzentruber, B.S.4
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44
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12444281294
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personal communication
-
Ruud Tromp (personal communication).
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Tromp, R.1
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45
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22944467599
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Surface Electronic Structure of Si(111)(7×7) Resolved in Real Space
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R. J. Hamers, R. M. Tromp, and J. E. Demuth, "Surface Electronic Structure of Si(111)(7×7) Resolved in Real Space," Phys. Rev. Lett. 56, 1972 (1986).
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(1986)
Phys. Rev. Lett.
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, pp. 1972
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Hamers, R.J.1
Tromp, R.M.2
Demuth, J.E.3
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46
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Surface Morphology of GaAs(110) by Scanning Tunneling Microscopy
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R. M. Feenstra and A. P. Fein, "Surface Morphology of GaAs(110) by Scanning Tunneling Microscopy," Phys. Rev. B 32, 1394 (1985). Also Randall M. Feenstra, http://stm1.phys.cmu.edu/stm/.
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Phys. Rev. B
, vol.32
, pp. 1394
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Fein, A.P.2
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Si(001) Dimer Structure Observed with Scanning Tunneling Microscopy
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R. M. Tromp, R. J. Hamers, and J. E. Demuth, "Si(001) Dimer Structure Observed with Scanning Tunneling Microscopy," Phys. Rev. Lett. 55, 1303 (1985).
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Phys. Rev. Lett.
, vol.55
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Tromp, R.M.1
Hamers, R.J.2
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49
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Origin of the Stability of Ge(105) on Si - A New Structure Model and Surface Strain Relaxation
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For example, Y. Fujikawa, K. Akiyama, T. Nagao, T. Sakurai, M. G. Lagally, T. Hashimoto, Y. Morikawa, and K. Terakura, "Origin of the Stability of Ge(105) on Si - a New Structure Model and Surface Strain Relaxation," Phys. Rev. Lett. 88, 176101 (2002).
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Fujikawa, Y.1
Akiyama, K.2
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Lagally, M.G.5
Hashimoto, T.6
Morikawa, Y.7
Terakura, K.8
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50
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11944255842
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Direct Determination of Step and Kink Energies on Vicinal Si(001)
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B. S. Swartzentruber, Y.-W. Mo, R. Kariotis, M. G. Lagally, and M. B. Webb, "Direct Determination of Step and Kink Energies on Vicinal Si(001)," Phys. Rev. Lett. 65, 1913 (1990).
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, vol.65
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Swartzentruber, B.S.1
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51
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35949011121
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Growth and Equilibrium Structures in the Epitaxy of Si on Si(001)
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Y.-W. Mo, B. S. Swartzentruber, R. Kariotis, M. B. Webb, and M. G. Lagally, "Growth and Equilibrium Structures in the Epitaxy of Si on Si(001)," Phys. Rev. Lett. 63, 2393 (1989).
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52
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Y.-W. Mo, J. Kleiner, M. B. Webb, and M. G. Lagally, "Activation Energy for Surface Diffusion of Si on Si(001); A Scanning Tunneling Microscopy Study," Phys. Rev. Lett. 66, 1998 (1991).
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Activation Energy for Surface Diffusion of Si on Si(001)
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Mo, Y.-W.1
Kleiner, J.2
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Lagally, M.G.4
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53
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A Scanning Tunneling Microscopy Study
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Y.-W. Mo, J. Kleiner, M. B. Webb, and M. G. Lagally, "Activation Energy for Surface Diffusion of Si on Si(001); A Scanning Tunneling Microscopy Study," Phys. Rev. Lett. 66, 1998 (1991).
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B. S. Swartzentruber, Y.-W. Mo, M. B. Webb, and M. G. Lagally, "Scanning Tunneling Microscopy Studies of Structural Disorder and Steps on Si Surfaces," J. Vac. Sci. Technol. A 7, 2901 (1989).
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Kinetic Pathway in Stranski-Krastanov Growth of Ge on Si(001
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Y.-W. Mo, D. E. Savage, B. S. Swartzentruber, and M. G. Lagally, "Kinetic Pathway in Stranski-Krastanov Growth of Ge on Si(001)," Phys. Rev. Lett. 65, 1020 (1990).
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Y.-W. Woody Mo (personal communication).
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Woody Mo, Y.-W.1
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note
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53 See any recent issue of Progress in Surface Science.
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Low-Energy Electron Microscopy
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edited by S. S. Breese (Academic, New York)
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E. Bauer, "Low-Energy Electron Microscopy," in Electron Microscopy, edited by S. S. Breese (Academic, New York, 1962), p. D-11.
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Electron Microscopy
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Elektronenmikroskipische Abbildung mit Licht Elektrischen Elektronen
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E. Bauer, "The Resolution of the Low-Energy Electron Reflection Microscope," Ultramicroscopy 17, 51 (1985).
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