Fast image segmentation based on multi-resolution analysis and wavelets

Pattern Recognition Letters

Volumn 24, Issue 16, 2003, Pages 2995-3006

  Kim, Byung Gyu ^a   Shim, Jae Ick ^a   Park, Dong Jo ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Feature space; Image segmentation; Multi resolution analysis; Multi threshold; Wavelets transform

Indexed keywords

ALGORITHMS; FEATURE EXTRACTION; WAVELET TRANSFORMS;

MULTI-RESOLUTION ANALYSIS;

IMAGE SEGMENTATION;

IMAGE ANALYSIS; IMAGE PROCESSING; SEGMENTATION; WAVELET ANALYSIS;

EID: 0142057161     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-8655(03)00160-0     Document Type: Article

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