Wavelet-based rotational invariant roughness features for texture classification and segmentation

IEEE Transactions on Image Processing

Volumn 11, Issue 8, 2002, Pages 825-837

  Charalampidis, Dimitrios ^a,b   Kasparis, Takis ^a,c  

^a IEEE   (United States)

^b UNO College of Engineering   (United States)

^c University of Central Florida   (United States)

Author keywords

Fractals; K means; Segmentation; Texture; Wavelets

Indexed keywords

ROTATIONAL INVARIANT ROUGHNESS;

FRACTALS; ITERATIVE METHODS; SURFACE ROUGHNESS; TEXTURES;

IMAGE SEGMENTATION;

EID: 0036688601     PISSN: 10577149     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIP.2002.801117     Document Type: Article

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