Correlation between Threshold Voltage and the S-factor of Polysilicon Thin-Film Transistors and the Changes due to Bias Stress

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 8, 2003, Pages 5014-5015

  Jang, Y H ^a   Park, W S ^a   Chun, M D ^a  

^a LG Display Co Ltd   (South Korea)

Author keywords

Bias stress; Density of states; Polysilicon; S factor; Thin film transistor; Threshold voltage

Indexed keywords

COMPUTER SIMULATION; CORRELATION METHODS; POLYSILICON; THIN FILM TRANSISTORS;

BIAS STRESS;

THRESHOLD VOLTAGE;

EID: 0142043965     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.5014     Document Type: Article

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