Local stress distribution in thermally-grown-oxide layer by near-field optical microscopy

Scripta Materialia

Volumn 50, Issue 1, 2004, Pages 137-141

  Tomimatsu, T ^a   Zhu, S J ^a   Kagawa, Y ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

Author keywords

Near field optical microscope; Photoluminescence spectroscopy; Stress distribution; Thermal barrier coating; Thermally grown oxide (TGO)

Indexed keywords

MICROSTRUCTURE; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OXIDES; PHOTOLUMINESCENCE; SPECTROSCOPY; STRESS ANALYSIS; STRESS CONCENTRATION;

THERMALLY GROWN OXIDE (TGO) LAYERS;

THERMAL BARRIER COATINGS;

EID: 0142043505     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2003.09.005     Document Type: Article

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