Submicrometer optical characterization of the grain boundary of optically active Cr3+ doped polycrystalline Al2O3 by near-field spectroscopy

American Mineralogist

Volumn 87, Issue 8-9, 2002, Pages 1144-1147

  Narita, Yoshihito ^a   Murotani, Hiroshi ^a  

^a Hachioji shi   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ALUMINUM OXIDE; CHROMIUM COMPOUNDS; CRYSTALS; FLUORESCENCE; GRAIN BOUNDARIES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; STRESS RELIEF;

FLUORESCENT SPECTROSCOPY; MICROSPECTROMETRY; NEAR FIELD SPECTRA; NEAR-FIELD SPECTROSCOPY; OPTICAL CHARACTERIZATION; OPTICALLY ACTIVE; POLYCRYSTALLINE ALUMINA; SPATIAL RESOLUTION;

CHROMIUM METALLOGRAPHY;

CHROMIUM; CORUNDUM; CRYSTAL STRUCTURE; GRAIN BOUNDARY; RUBY; SPECTRAL ANALYSIS;

EID: 0036698903     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am-2002-8-912     Document Type: Article

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