A highly sensitive scanning far-infrared microscope with quantum Hall detectors

Review of Scientific Instruments

Volumn 74, Issue 9, 2003, Pages 4209-4211

  Ikushima, Kenji ^a   Sakuma, Hisato ^a   Komiyama, Susumu ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; LENSES; SCANNING; SENSITIVITY ANALYSIS; SIGNAL TO NOISE RATIO;

FAR-INFRARED (FIR) MICROSCOPES;

MICROSCOPES;

EID: 0142039146     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1599061     Document Type: Article

References (7)

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7. Y. Kawano and S. Komiyama, Phys. Rev. B 61, 2931 (2000).