Using symmetry in robust model fitting

Pattern Recognition Letters

Volumn 24, Issue 16, 2003, Pages 2953-2966

  Wang, Hanzi ^a   Suter, David ^a  

^a MONASH UNIVERSITY   (Australia)

Author keywords

Breakdown point; Clustered outliers; Robust regression; Symmetry distance

Indexed keywords

COMPUTER VISION; REGRESSION ANALYSIS; ROBUSTNESS (CONTROL SYSTEMS);

MODEL FITTING;

PATTERN RECOGNITION;

PATTERN RECOGNITION;

EID: 0142025165     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-8655(03)00156-9     Document Type: Article

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