Parametric model fitting: from inlier characterization to outlier detection

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 20, Issue 3, 1998, Pages 263-280

  Danuser, Gaudenz ^a   Stricker, Markus ^a  

^a MARINE BIOLOGICAL LABORATORY   (United States)

Author keywords

Classify while fit; Data snooping; Errors in variables; Generalized least squares; Parametric models; Planes; Self diagnosis; Straight lines

Indexed keywords

ALGORITHMS; COMPUTATIONAL GEOMETRY; COMPUTER VISION; DATA REDUCTION; ERROR ANALYSIS; FEATURE EXTRACTION; LEAST SQUARES APPROXIMATIONS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; PROBLEM SOLVING; ROBUSTNESS (CONTROL SYSTEMS); STATISTICAL TESTS;

DATA SNOOPING; PARAMETRIC MODEL FITTING;

IMAGE ANALYSIS;

EID: 0032028224     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.667884     Document Type: Article

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