A four-point probe correlation of oxygen sensitivity to changes in surface resistivity of TiO2(0 0 1) and Pd-modified TiO2(0 0 1)

Surface Science

Volumn 545, Issue 1-2, 2003, Pages

  McCormick, John R ^a   Kitchin, John R ^b   Barteau, Mark A ^b   Chen, Jingguang G ^a,b  

^a UNIVERSITY OF DELAWARE   (United States)

^b University of Delaware   (United States)

Author keywords

Palladium; Scanning tunneling microscopy; Semiconducting surfaces; Surface electrical transport (surface conductivity, surface recombination, etc.); Titanium oxide

Indexed keywords

CHEMICAL SENSORS; ELECTRIC RESISTANCE; OXIDATION; OXYGEN; PALLADIUM; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; SPUTTERING; STOICHIOMETRY; TITANIUM DIOXIDE; ULTRAHIGH VACUUM;

FOUR-POINT PROBE (FPP);

SURFACE PROPERTIES;

EID: 0142023762     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2003.08.041     Document Type: Article

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