Scanning tunnelling microscopy of tetracene on Si(1000)-2 × 1

Journal of Physics Condensed Matter

Volumn 15, Issue 38, 2003, Pages

  Rada, T ^a,b   Chen, Q ^a   Richardson, N V ^a  

^a UNIVERSITY OF ST ANDREWS   (United Kingdom)

^b UNIVERSIDAD DEL NORTE   (Colombia)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; BONDING; DIMERS; FERMI LEVEL; IMAGE ANALYSIS; MOLECULES; NUMERICAL METHODS; SCANNING TUNNELING MICROSCOPY; SURFACES;

BONDING ARRANGEMENTS; CHARGE DENSITIES; TETRACENE;

SEMICONDUCTING SILICON;

EID: 0142008302     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/15/38/013     Document Type: Article

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