Probing structural phase transitions of crystalline C60 via resistivity measurements of metal film overlayers

Solid State Communications

Volumn 128, Issue 9-10, 2003, Pages 359-363

  Chang, C W ^a   Regan, B C ^a   Mickelson, W ^a   Ritchie, R O ^a   Zettl, A ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

A. Fullerene; A. Metal film; D. Phase transition

Indexed keywords

CRYSTALS; ELECTRIC RESISTANCE; ELECTRONIC STRUCTURE; INTERFACES (MATERIALS); METALLIC FILMS; PHASE TRANSITIONS; THIN FILMS;

CRYSTALLINE SOLIDS;

FULLERENES;

EID: 0141963765     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2003.08.042     Document Type: Article

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