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Volumn 1, Issue , 2003, Pages 171-174

Trial design of compact solid insulated connection system and experimental investigation on its electrical insulation performance

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC INSULATION TESTING; ELECTRIC NETWORK SYNTHESIS; ELECTRIC POTENTIAL; ELECTRIC SUBSTATIONS; ELECTRIC SWITCHGEAR; ELECTRIC TRANSFORMERS; RUBBER; SILICONES;

EID: 0141939415     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (2)
  • 1
    • 0141931897 scopus 로고    scopus 로고
    • Development of all solid compact connector (hyper-connector) for high voltage equipment - Investigation of initial breakdown characteristics under ac voltage condition using interface models
    • Yokosuka Reseearch Laboratory Rep. No. W01025, CRIEPI; (in Japanese)
    • T. Takahashi, T. Takeda, T. Takahashi and T. Okamoto: "Development of All Solid Compact Connector (Hyper-connector) for High Voltage Equipment - Investigation of Initial Breakdown Characteristics under ac Voltage Condition Using Interface Models-", Yokosuka Reseearch Laboratory Rep. No. W01025, CRIEPI, 2002. (in Japanese)
    • (2002)
    • Takahashi, T.1    Takeda, T.2    Takahashi, T.3    Okamoto, T.4
  • 2
    • 0036443812 scopus 로고    scopus 로고
    • Development of all solid compact connection system for high voltage equipment - Effect of thin air layer on breakdown strength of solid-solid interface
    • IEEE-DEIS, Cancun, Mexico
    • T. Takahashi, T. Takahashi, T. Takeda, and T. Okamoto: "Development of all solid compact connection system for high voltage equipment - Effect of thin air layer on breakdown strength of solid-solid interface-", 2002 Annual Report, Conference on Electrical Insulation and Dielectric Phenomena, pp. 486-489, IEEE-DEIS, Cancun, Mexico, 2002.
    • (2002) 2002 Annual Report, Conference on Electrical Insulation and Dielectric Phenomena , pp. 486-489
    • Takahashi, T.1    Takahashi, T.2    Takeda, T.3    Okamoto, T.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.