Time series analysis in a frequency subband

IEEE Transactions on Instrumentation and Measurement

Volumn 52, Issue 4, 2003, Pages 1054-1060

  Broersen, Piet M T ^a   De Waele, Stijn ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

ARMA process; Frequency selective; Order selection; Peak detection; Spectral analysis; Time series models

Indexed keywords

COMPUTER SIMULATION; FOURIER TRANSFORMS; MAGNETIC RESONANCE SPECTROSCOPY; RANDOM PROCESSES; REGRESSION ANALYSIS;

FREQUENCY SUBBAND; ORDER SELECTION;

TIME SERIES ANALYSIS;

EID: 0141920320     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2003.814823     Document Type: Article

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