Facts and fiction in spectral analysis

IEEE Transactions on Instrumentation and Measurement

Volumn 49, Issue 4, 2000, Pages 766-772

  Broersen, P M T ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; PARAMETER ESTIMATION; RANDOM PROCESSES; REGRESSION ANALYSIS; TIME SERIES ANALYSIS;

AUTOREGRESSIVE MOVING AVERAGE (ARMA) MODEL; SPECTRAL DENSITY;

SPECTRUM ANALYSIS;

EID: 0034249135     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.863921     Document Type: Article

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