Soft X-Ray Resonant Scattering: An Element-Specific Tool to Characterize Patterned Arrays of Nanomagnets

IEEE Transactions on Magnetics

Volumn 39, Issue 5 II, 2003, Pages 3450-3452

  Sánchez Hanke, Cecilia ^a   Castaño, Fernando J ^b   Hao, Y ^b   Hulbert, Steven L ^a   Ross, Caroline A ^b   Smith, Henry I ^c   Kao, Chi Chang ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b Massachusetts Institute of Technology Cambridge   (United States)

^c Department of Electrical Engineering and Computer Science   (United States)

Author keywords

Magnetic circular dichroism; Magnetization processes; Patterned arrays; Soft X ray magnetic scattering

Indexed keywords

DIFFRACTION GRATINGS; MAGNETIC HYSTERESIS; MAGNETIZATION; MAGNETS;

MAGNETIC CIRCULAR DICHROISM;

X RAY SCATTERING;

EID: 0141918386     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2003.816179     Document Type: Article

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