Simulation study on the measurements of diffusion coefficients in solid materials by short-lived radiotracer beams

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 7 A, 2003, Pages 4576-4583

  Jeong, Sun Chan ^a   Katayama, Ichiro ^a   Kawakami, Hirokane ^a   Ishiyama, Hironobu ^a   Miyatake, Hiroari ^a   Sataka, Masao ^b   Iwase, Akihiro ^b   Okayasu, Satosi ^b   Sugai, Hiroyuki ^b   Ichikawa, Shinichi ^b   Nishio, Katsuhisa ^b   Sugiyama, Yasuharu ^c   Yahagi, Masahito ^d   Takada, Kazunori ^e   Watanabe, Mamoru ^e  

^a INSTITUTE OF PARTICLE AND NUCLEAR STUDIES   (Japan)

^b JAPAN ATOMIC ENERGY AGENCY   (Japan)

^c Nihon Advanced Technology   (Japan)

^d AOMORI UNIVERSITY   (Japan)

^e NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

8Li; Concentration depth profile; Diffusion coefficient; Implantation in LiAl; On line measurement; Short lived radiotracer beams; Time dependent yield spectra

Indexed keywords

ALPHA PARTICLES; COMPUTER SIMULATION; DIFFUSION IN SOLIDS; ION IMPLANTATION; LITHIUM; ONLINE SYSTEMS; RADIOACTIVE TRACERS; SPECTRUM ANALYSIS;

CONCENTRATION DEPTH PROFILE; ONLINE MEASUREMENT; SHORT LIVED RADIOTRACER BEAMS; TIME DEPENDENT YIELD SPECTRA;

RADIOACTIVITY MEASUREMENT;

EID: 0141829215     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.4576     Document Type: Article

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