Measurement of the noibium/sapphire interface toughness via delamination (International Journal of Fracture, 119/120, 4-2, (441-448), 10.1023/A:1024936014552);Measurement of the noibium/sapphire interface toughness via delamination

International Journal of Fracture

Volumn 120, Issue 1-2, 2003, Pages 441-448

  Je, H ^a   Was, G S ^a   Thouless, M D ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Buckling; Delamination; IBAD; Interface; Niobium; Toughness

Indexed keywords

COMPRESSIVE STRESS; INTERFACES (MATERIALS); ION BEAM ASSISTED DEPOSITION; ION BOMBARDMENT; NIOBIUM; PHYSICAL VAPOR DEPOSITION; SAPPHIRE;

STRESS GRADIENT;

FRACTURE TOUGHNESS;

DELAMINATION; TOUGHNESS;

EID: 0141817123     PISSN: 03769429     EISSN: 15732673     Source Type: Journal    
DOI: 10.1007/s10704-004-0197-7     Document Type: Erratum

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