Alignment of valence photoemission, x-ray absorption, and substrate density of states for an adsorbate on a semiconductor surface

Physical Review B - Condensed Matter and Materials Physics

Volumn 67, Issue 23, 2003, Pages

  Schnadt, J ^a,e   O'Shea J N ^b   Patthey, L ^c   Krempasky J ^c   Martensson N ^a,d   Bruhwiler P A ^a,f  

^a UPPSALA UNIVERSITY   (Sweden)

^b UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

^d LUND UNIVERSITY   (Sweden)

^e AARHUS UNIVERSITY   (Denmark)

^f SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ACID; BENZOIC ACID; BIISONICOTINIC ACID; ISONICOTINIC ACID; TITANIUM DIOXIDE; UNCLASSIFIED DRUG;

ADSORPTION; ANALYTIC METHOD; ARTICLE; DENSITY; PHOTOEMISSION SPECTROSCOPY; SEMICONDUCTOR; SPECTROSCOPY; X RAY ABSORPTION SPECTROSCOPY;

EID: 0141773352     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.67.235420     Document Type: Article

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