In situ formation, reactions, and electrical characterization of molecular beam epitaxy-grown metal/semiconductor interfaces

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 17, Issue 4, 1999, Pages 1307-1312

  Chen, L C ^a   Caldwell, D A ^a   Finstad, T G ^b   Palmstrom C J ^a  

^a University of Minnesota   (United States)

^b UNIVERSITY OF OSLO   (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0141749827     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581910     Document Type: Article

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