메뉴 건너뛰기




Volumn 51, Issue 3-4, 1998, Pages 371-384

Photoluminescence characterization of polycrystalline CuGaSe2 thin films grown by rapid thermal processing

Author keywords

Homogeneity; Thermal processing; Thin films

Indexed keywords

ANNEALING; COPPER COMPOUNDS; FILM GROWTH; FILM PREPARATION; PHOTOLUMINESCENCE; POLYCRYSTALLINE MATERIALS; SPECTROSCOPIC ANALYSIS; SUBSTRATES; THIN FILMS;

EID: 0141749249     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(97)00256-0     Document Type: Article
Times cited : (6)

References (33)
  • 29
    • 0348084244 scopus 로고
    • Ph.D. Thesis, University of Konstanz, Konstanz
    • W. Simon, Ph.D. Thesis, University of Konstanz, Konstanz 1994.
    • (1994)
    • Simon, W.1
  • 31
    • 0041748961 scopus 로고
    • Röntgenpulverdiffraktometrie: Rechnergestützte Auswertung, Phasenanalyse und Strukturbestimmung
    • R. Altmann, Röntgenpulverdiffraktometrie: Rechnergestützte Auswertung, Phasenanalyse und Strukturbestimmung, Clausthaler Tektronische Hefte 29 (1994).
    • (1994) Clausthaler Tektronische Hefte , vol.29
    • Altmann, R.1
  • 32
    • 0346823446 scopus 로고
    • Ph.D. Thesis, University of Stuttgart, Stuttgart
    • R. Klenk, Ph.D. Thesis, University of Stuttgart, Stuttgart 1994.
    • (1994)
    • Klenk, R.1
  • 33
    • 0348084245 scopus 로고    scopus 로고
    • JCPDS, International Center for Diffraction Data, Sets 1-43, PA 19073, USA, 1993
    • JCPDS, International Center for Diffraction Data, Sets 1-43, PA 19073, USA, 1993.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.