Rigorous coupled wave analysis of radially and azimuthally-inhomogeneous, elliptical, cylindrical systems

Progress in Electromagnetics Research

Volumn 34, Issue , 2001, Pages 89-115

  Jarem, J M ^a  

^a UNIVERSITY OF ALABAMA IN HUNTSVILLE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL SURFACE CURRENTS; ELECTROMAGNETIC ANALYSIS; INHOMOGENEOUS DIELECTRICS; MATHIEU FUNCTION EXPANSIONS; PLANAR DIFFRACTION GRATING; RIGOROUS COUPLED WAVE ANALYSIS; SPATIALLY HOMOGENEOUS; SPATIALLY INHOMOGENEOUS;

DIFFRACTION; EIGENVALUES AND EIGENFUNCTIONS; ELECTROMAGNETIC WAVE SCATTERING; NUMERICAL METHODS; PERMITTIVITY;

ALGORITHMS;

EID: 0141734620     PISSN: 10704698     EISSN: 15598985     Source Type: Journal    
DOI: 10.2528/PIER01032302     Document Type: Article

References (21)

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