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Volumn 5039 II, Issue , 2003, Pages 1204-1211
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Novel silicon containing polymers as photoresist materials for extreme UV lithography
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Author keywords
Chemical amplification; EUV lithography; Polysilane; Ring opening metathesis polymerization; Silicon containing polymer
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Indexed keywords
COMPLEXATION;
COPOLYMERIZATION;
INTERFEROMETRY;
MOLECULAR WEIGHT;
ORGANIC POLYMERS;
RING OPENING POLYMERIZATION;
SILICON COMPOUNDS;
SYNTHESIS (CHEMICAL);
ULTRAVIOLET RADIATION;
ACID SENSITIVE MONOMERS;
CHEMICALLY AMPLIFIED POLYSILANE-COPOLYMERS;
NORBORNENES;
PHOTORESIST MATERIALS;
POLYMER PLATFORMS;
RING OPENING METATHESIS POLYMERIZATION;
PHOTORESISTS;
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EID: 0141722617
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.485184 Document Type: Conference Paper |
Times cited : (26)
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References (14)
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