메뉴 건너뛰기




Volumn 68, Issue 3-4, 2003, Pages 535-539

Surface and interfacial effect on polymer glass transition temperature studied by positron annihilation

Author keywords

Glass transition temperature; Interface; Polymer film; Positron; Surface

Indexed keywords

DOPPLER EFFECT; GLASS TRANSITION; PLASTIC FILMS; POSITRONS; SURFACE CHEMISTRY;

EID: 0141720875     PISSN: 0969806X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0969-806X(03)00225-1     Document Type: Conference Paper
Times cited : (10)

References (12)
  • 1
  • 2
    • 0034702673 scopus 로고    scopus 로고
    • Thermal probe measurements of the glass transition temperature for ultrathin polymer films as a function of thickness
    • Fryer D.S., Nealey P.F., De Pablo J. Thermal probe measurements of the glass transition temperature for ultrathin polymer films as a function of thickness. Macromolecules. 33(17):2000;6439-6447.
    • (2000) Macromolecules , vol.33 , Issue.17 , pp. 6439-6447
    • Fryer, D.S.1    Nealey, P.F.2    De Pablo, J.3
  • 4
    • 0038427351 scopus 로고
    • Fast positronium formation and dissociation at surfaces
    • Gidley D.W., McKinsey D.N., Zitzewitz P.W. Fast positronium formation and dissociation at surfaces. J. Appl. Phys. 78(3):1995;1406-1410.
    • (1995) J. Appl. Phys. , vol.78 , Issue.3 , pp. 1406-1410
    • Gidley, D.W.1    McKinsey, D.N.2    Zitzewitz, P.W.3
  • 7
    • 0000837957 scopus 로고    scopus 로고
    • Glass transition of polystyrene near the surface studied by slow-positron-annihilation spectroscopy
    • Jean Y.C., Zhang R., Cao H., Yuan J-P., Huang C-M. Glass transition of polystyrene near the surface studied by slow-positron-annihilation spectroscopy. Phys. Rev. B. 56(14):1997;8459-8462.
    • (1997) Phys. Rev. B , vol.56 , Issue.14 , pp. 8459-8462
    • Jean, Y.C.1    Zhang, R.2    Cao, H.3    Yuan, J-P.4    Huang, C-M.5
  • 8
    • 3142708481 scopus 로고
    • Interaction of positron beams with surfaces, thin films, and interfaces
    • Schultz P.J., Lynn K.G. Interaction of positron beams with surfaces, thin films, and interfaces. Rev. Mod. Phys. 60:1988;701-779.
    • (1988) Rev. Mod. Phys. , vol.60 , pp. 701-779
    • Schultz, P.J.1    Lynn, K.G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.